SSC CPO Admit Card 2017 for SI and ASI Delhi Police CAPF CISF
SSC CPO Admit Card 2017 available
Staff Selection Commission (SSC) released the hall tickets for the Paper I for Sub Inspector and ASI Recruitment in Delhi Police, CAPF & CISF. The Central Police Organization recruitment both male and female candidates have been released. Online applications are asked to visit the official SSC registration website.
SSC CPO Application Status is now available.To know more about the examination details visit www.ssconline.nic.in. Staff Selection Commission will be conducting Central Police Organization (CPO) 2017 (Written Test) from 30 June to 07 July 2017. Examination date for Paper II SSC CPO Exam to be conducted on 8 October 2017.
The selection process for CPO is examined through Physical Test, Medical, etc., in Paper I and II. Finalized candidates are recruited as Sub-Inspectors in Delhi Police & Central Armed Police Forces (CAPFs) and Assistant Sub-Inspectors (ASI) in Central Industrial Security Force.
The selection process for SSC CPO Exam:
Applicants who are eligible as per their submitted application will have to undergo the following selection scheme for their final rounds:
i) The first stage involves with the Paper I eligibility process.
ii)The physical test (PET & PST) is the second stage of the selection process for the candidates who crack their written examination paper with qualifying marks subject to the commission’s decision.
After the PET, PST, the second paper ( Paper II) will be conducted.
Candidates who have completed their selection process will be notified of their recruitment in the official website.
SSC CPO Exam further Specification
Name of the authorisation: Staff Selection Commission (SSC)
No. of Vacancies:2221 posts
Sub- Inspector Delhi Police (Male) – 161
Sub- Inspector Delhi Police (Female) – 83
Sub- Inspector in CAPFs – 2989
ASI in CISF- 1532
Important dates to be notified.
SSC CPO Paper, I Exam dates: from 30 June to 07 July 2017.
SSC CPO Paper II Exam Date:8 October 2017
For further details about the examination process, Click here.